Yao, Chen, Nankai University, China
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Vol 3, No 3: September 2014 - Telecommunication Engineering
Leakage Analysis and Solution of the RFID Analog Front-END
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Bulletin of Electrical Engineering and Informatics (BEEI)
ISSN: 2089-3191, e-ISSN: 2302-9285
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).