Kadir, Farhana Mohamad Abdul, University Malaysia Sarawak, Malaysia
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Vol 13, No 6: December 2024 - Electronics Device and Semiconductor
The analysis of soft error in static random access memory and mitigation by using transmission gate
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Bulletin of Electrical Engineering and Informatics (BEEI)
ISSN: 2089-3191, e-ISSN: 2302-9285
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).