E. Kaharudin, K., Universiti Teknikal Malaysia Melaka (UTeM), Malaysia

• Vol 8, No 4: December 2019 - Electronics Device and Semiconductor
  Performance analysis of ultrathin junctionless double gate vertical MOSFETs
  Abstract  PDF

Bulletin of EEI Statistics

Bulletin of Electrical Engineering and Informatics (BEEI)
ISSN: 2089-3191 , e-ISSN: 2302-9285
This journal is published by the Institute of Advanced Engineering and Science (IAES) .