Snehal Mohan, Kamlapur, India

• Vol 1, No 1: March 2012 - Special Invitation
  Super Resolution Imaging Needs Better Registration for Better Quality Results
  Abstract  PDF

Bulletin of EEI Statistics

Bulletin of Electrical Engineering and Informatics (BEEI)
ISSN: 2089-3191 , e-ISSN: 2302-9285
This journal is published by the Institute of Advanced Engineering and Science (IAES) .